The Surface Analysis Faciliity of the University of Notre Dame houses a Kratos XSAM multi technique electron spectrometer.
The instrument has been recently upgraded with a new Multi-channel detection system which replaces much of the instruments origanal electronics as well as the data sytem.
Upgrade Includes:
The Multi-Channel Detector, which consists of five Channeltron Multipliers for increased sensitivity and faster aquisition times.
All new computer controlled electronics.
A Sun Workstation with a Tetronix Phaser 340 Color Laser jet printer to run Kratos' Vision Data System.
A new Phi Model 04-303 Sputtering Ion Gun with a Phi Model 11-065 Ion Gun Controller.
A Phi Digital Ion Guage Controller with Ultek UHV nude ion guages.
Send comments or suggestions to: Surfsci Lab
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This Web Page was created by David Griffiths and Joe Knutzen.
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