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JEOL JXA-8600 Superprobe
4 WDS Spectrometers with the following crystals:
TAP(2)
PET(2)
LIF(2)
STE
LDE1
Noran fixed position Si(Li) ultra-thin window light element EDS detector
Scanning Electron Microscopy:
Secondary Electron Imaging
Backscatter Electron Imaging (topographic or compositional contrast)
For more information visit the JEOL USA, Inc. website: www.jeol.com
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Copyright © 2003 University of Notre Dame |