Directory
Analyses
[Introduction]
[Sample Submission]
[Instruments]
[Analyses]
[Usage Report]
[Ionization Modes]
[What's New]
[Links]
Low Resolution Mass Spectrum
A low resolution mass spectrum provides nominal (or integer) m/z values. Isotopic patterns are often evident in a low resolution mass spectrum.

High Resolution Mass Spectrum
A high resolution mass spectrum provides separation of isobaric peaks which appear at the same nominal m/z value.

MS Facility Home Page.

Accurate Mass Measurements
Accurate mass measurements are used to determine the elemental composition of the ion of interest. The m/z value is determined under high resolution conditions to an accuracy within the low parts per million region. The higher the m/z value, the more difficult the accurate mass measurement becomes. Because of this difficulty, the MS Facility sets an upper limit of 1,000 u for accurate mass measurements. Above this limit, a good match between theoretically expected and experimentally measured isotope patterns is suggested as an acceptable alternative.
Learn more about exact mass measurements from JEOL.
SIS isotope patterns and exact mass calculator

Gas Chromotography/Mass Spectrometry (GC/MS)
GCMS is the combination of a powerful separation technique, GC, with a versatile detector,MS. Components of a mixture are separated by the GC and mass spectra are recorded. EI and CI modes of ionization are avialable for GCMS.
GCMS in the MS Facility
Liquid Chromotography/Mass Spectrometry (LC/MS)
Like GCMS, LCMS combines a powerful separation technique with a versatile detector. Mixtures of thermally labile samples are separated with a LC and a mass spectrum of each component is obtained. Two LCMS interfaces are available with the Micromass Quattro LC: Electrospray ionization (ESI), and Atmospheric Pressure Chemical Ionization(APCI) The JEOL AX505HA is also equipped with a Frit-FAB interface.
LCMS in the MS Facility
MS/MS Experiments
MS/MS experiments are useful for structure elucidation. Three types of MS/MS experiments available in the MS Facility are described below.
  • Product Ion Scans: This experiment can be used to determine the fragment ions which arise from a selected precursor ion. (Also known as Daughter ion scans.)
  • Precursor Ion Scans: This experiment can be used to determine the precursor ions which give rise to a selected fragment ion. (Also known as parent ion scans.)
  • Constant Neutral Loss Scans: This experiment can be used to determine which ions undergo the loss of a given neutral fragment.

  • Linked Scan Experiments
    Linked Scan experiments are available on the JEOL AX505HA for structure elucidation. Three types of linked scan experiments available in the MS Facility are described above under MS/MS experiments.

    [Introduction][Sample Submission][Analyses][Usage Report][Instruments][Ionization Modes][What's New][Links]