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Results Comparitive Data: Two different AFMs were used to scan the same samples. Resulting images show the resolutions of the two microscopes. AlGaN/GaN Scans: Topographic images of three different AlGaN/GaN samples. Composition of samples is constant; growth conditions vary between samples. Tip Usage: Determines the effective lifetime of tips used in AFM. p-n Junctions: Topographig images of two p-n samples. |
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