Environmental SEM/EDS

- -Environmental Scanning Electron Microscopes allow the user to also image their samples in a wet chamber and view structure without the impact of moisture loss (on biological material, for example). Magnification limits for the LEO EVO 50 is in the high nanometer to low micrometer range depending on surface and sample characteristics (conductivity, topology etc.) - - Attached to the EVO system is the Oxford INCA Energy Dispersive Spectometer (EDS) which uses an x ray source to generate spectral information related to elemental composition, in addition to surface topology (as viewed with the SEM). Elemental compositonal information is also sample dependent.- - -

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