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JEOL JXA-8600 Suberprobe
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JEOL JXA-8600 Superprobe

4 WDS Spectrometers with the following crystals:

• TAP(2)
• PET(2)
• LIF(2)
• STE
• LDE1

Noran fixed position Si(Li) ultra-thin window light element EDS detector

Scanning Electron Microscopy:

• Secondary Electron Imaging
• Backscatter Electron Imaging (topographic or compositional contrast)

For more information visit the JEOL USA, Inc. website: www.jeol.com